noun
AFM stands for Atomic Force Microscopy, a type of scanning probe microscopy that provides high-resolution images of surfaces at the atomic level.
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Atomic Force Microscopy (AFM) is a powerful tool used in nanotechnology research.
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I used AFM to study the surface of the material under the microscope.
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AFM is like magic, it can show us things at the nanoscale!
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AFM acts like a detective, revealing hidden details on the surface of the sample.