noun AFM stands for Atomic Force Microscopy, a type of scanning probe microscopy that provides high-resolution images of surfaces at the atomic level.
AFM can be used in chemistry to investigate surface properties of materials and study molecular interactions.
AFM is applied in physics to study surface topography and mechanical properties of materials at the atomic level.
In biology, AFM is utilized to study biological samples at the molecular and cellular level, providing high-resolution images and mechanical measurements.
AFM is commonly used in materials science to study surface properties, such as roughness, adhesion, and mechanical properties.
In the field of nanotechnology, AFM (Atomic Force Microscopy) is used to image and manipulate materials at the nanoscale.
In the field of nanotechnology, AFM (Atomic Force Microscopy) is used by writers to study the surface of materials at the nanoscale level for research and writing purposes.
Psychologists may use AFM (Atomic Force Microscopy) to analyze the structure and properties of biological samples at the molecular level for research in the field of psychology.
Engineers utilize AFM (Atomic Force Microscopy) for surface imaging and analysis in various engineering applications such as materials science, mechanical engineering, and nanotechnology.
Biologists may use AFM (Atomic Force Microscopy) to study biological samples and analyze their surface properties at the molecular level for research in the field of biology.
Chemists utilize AFM (Atomic Force Microscopy) for studying the surface properties of chemicals and materials at the atomic level for research and analysis in the field of chemistry.